Computer-Aided Test Generation for Four-Phase MOS LSI Circuits
نویسنده
چکیده
In this paper a practical approach to generate fault detection tests for four-phase MOS LSI circuits is discussed. Emphasis is given to a computer aid on the generation of both primary output and primary input test sequences. A technique to preset the circuit to predictable logic levels is presented.
منابع مشابه
Method of Auto : matic Fault - Detection Test Generation
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عنوان ژورنال:
- IEEE Trans. Computers
دوره 18 شماره
صفحات -
تاریخ انتشار 1969